Thermal resistance tester
The transient thermal resistance tester is a device that measures the transient thermal resistance of IGBT, MOS-FET, diode, BJT, etc.
The BJT transient thermal resistance measurement device applies a specified power between the collector and emitter, raises the chip temperature, and measures the difference in base-emitter voltage (ΔVBE) using the small currents (Im) before and after. This allows for the estimation of the thermal resistance of the sample. The IGBT transient thermal resistance measurement device, similar to the BJT transient thermal resistance measurement device, measures the voltage difference between the gate and emitter (ΔVGE). The P-MOS FET transient thermal resistance measurement device, like the BJT transient thermal resistance measurement device, measures the voltage difference between the gate and source (ΔVGS). The BJT transient thermal resistance measurement device can measure the ΔVF of the diode between the base and emitter.
- Company：コペル電子
- Price：Other
